QFM-Module

The QFM-Module is designed for dynamic scanning force microscopy and spectroscopy. The add-on device comprises dedicated hardware and software.

Further information is summarized in the following handout:

Handout 'QFM-Module' [PDF, 1.0MB]

A demo version of the analysis software for the QFM-Module is available for download:

Demo-Software 'QFM-Module' [ZIP, 5.8MB]

Further reading:


Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids
H. Hölscher, D. Ebeling, J.-E. Schmutz, M. M. Schäfer, B. Anczykowski
in Scanning Probe Microscopy in Nanoscience and Nanotechnology, Chapter 1, pp. 3-21
B. Bushan (Ed.)
Springer Verlag Berlin Heidelberg 2010
ISBN 978-3-642-03534-0

Increasing the Q-factor in the Constant-Excitation Mode of Frequency-Modulation Atomic Force Microscopy in Liquid
D. Ebeling, H. Hölscher, B. Anczykowski
Appl. Phys. Lett. 89, 203511 (2006).

Quantitative Measurement of Tip-Sample Interactions by Dynamic Force Spectroscopy in Ambient Conditions
H. Hölscher, B. Anczykowski
Surf. Sci. 579, 21 (2005).

On dynamic force spectroscopy using the frequency modulation technique with constant excitation
H. Hölscher, B. Gotsmann, A. Schirmeisen
Phys. Rev. B 68, 153401 (2003).

Dynamic Force Spectroscopy in UHV Using the Constant-Amplitude And Constant-Excitation Mode
A. Schirmeisen, H. Hölscher, B. Ancyzkowski, D. Weiner, M. M. Schäfer, H. Fuchs
Nanotechnology 16, S13 (2005).

Mapping the Tip-Sample Interactions on Biological Samples by Dynamic Force Spectroscopy under Ambient Conditions
J.-E. Schmutz, H. Hölscher, D. Ebeling, M. M. Schäfer, and B. Anczykowski
Ultramicropscopy 107, 875 (2007).

For price and availability information contact our distribution partner:

Schaefer Group (Europe)