Atomic Force Microscopy (AFM)

Strengths of the technique

3D measuring of surfaces
Analysis of roughness, step heights, and pitch
Applicable under vakuum, liquids, and ambient conditions
Imaging of lateral distributions of electrostatic or magnetic fields
Analysis of material contrasts down to the nanometer scale
Nano-hardness testing

Technical Data

Depth of information:	~ 1 monolayer
Vertical resolution:	down to 0.3 nm
Lateral resolution:	down to 0.3 nm
Max. field of view:	~ 100 x 100 µm²

Further information

Courses